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Abstract Mechanically flexible electronics are devices designed to operate under significant physical deformations such as bending, twisting, and stretching. While the materials systems and devices compatible with flexible substrates have been extensively studied, the mathematical framework for analysis remains identical to that of traditional planar silicon-based electronics. However, the non-planar and dynamic form factors desired from flexible electronics invalidate assumptions made in these models. For electronic devices to be predictable and ultimately commercially viable, they must be understood in any physical form. Here we employ the method of moments to calculate the capacitance between two electrical conductors of arbitrary shape. Combined with a model for source–drain current in thin-film transistors (TFTs) on the surface of a cylinder, we are able to calculate the current–voltage characteristics in curved TFTs as a function of bending angle. We demonstrate how deformations to device geometry are expected to lead to non-negligible changes in current–voltage characteristics. This work represents the first step towards a new framework for understanding and characterizing electronics with any physical form factor, ultimately bringing flexible electronics closer to commercial viability. 

The contactless characterization technique time resolved microwave conductivity (TRMC) provides a means to rapidly and unambiguously approximate carrier mobilities and lifetimes for a variety of semiconducting materials. When using a cavity-based approach however, the technique can conventionally only resolve carrier mobilities in the plane of the substrate. In solar cells, charge carriers are extracted in the direction perpendicular to the substrate, therefore it would be beneficial if one were able to evaluate the mobility in this direction also. Here we present a novel approach for resolving charge carrier mobilities in different planes within a sample. Using a range of 3D-printed sample holders, where the sample is held at various angles relative to the incident light, we are able to simultaneously resolve the mobility in the plane of the sample and out of the plane of the sample. As examples, we have studied the 3-dimensional corner-connected metal halide perovskite methylammonium lead iodide and the 2-dimensional perovskite precusor, lead iodide.